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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 240AC-SG with a sharp diamond-like spike is designed for high resolution AC mode AFM imaging of soft samples. The gold coating ensures high and stable laser reflectivity in air and liquids. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
70 nm Au on both sides of the cantilever. The coating does not cover the diamond-like spike! | |||
AFM Tip | |||
Shape | Supersharp, OPUS | ||
Height | 14um (12-16um) | ||
Radius | <1nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 240um (230-250um) | ||
Width | 40um (38-42um) | ||
Thickness | 2.6um (2.1-3.1um) | ||
Force Constant | 2N/m (0.6-3.9N/m) | ||
Resonance Frequency | 70kHz (45-90kHz) | ||