AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 3XC series features three different cantilevers for various measurement modes: 500DC - Contact mode cantilever 200AC - Standard AC mode cantilever 240AC - Soft AC mode cantilever for imaging soft samples
The gold coated version is suitable for biological applications, tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
70 nm Au on both sides of the cantilever |
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AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <30nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Contact mode Cantilever | Stadard tapping mode Cantilever | Soft tapping mode Cantilever | |
Shape | Beam | Beam | Beam |
Length | 500um (490-510um) | 175um (165-185um) | 240um (230-250um) |
Width | 30um (28-32um) | 40um (38-42um) | 30um (28-32um) |
Thickness | 3um (2.5-3.5um) | 3um (2.5-3.5um) | 3um (2.5-3.5um) |
Force Constant | 0.3N/m (0.1-0.6N/m) | 9N/m (2.8-21N/m) | 2.5N/m (0.75-5.3N/m) |
Resonance Frequency | 17kHz (11-22kHz) | 150kHz (100-200kHz) | 75kHz (50-100kHz) |