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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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This competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge tip overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm macroscopic half cone angle of 35°
Consistent high quality at a lower price!
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Gold/Chromium on detector side of the cantilever, 70 nm thick. |
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AFM Tip | |||
Shape | Pyramid | ||
Height | 12um (10-14um) | ||
Radius | <15nm | ||
Half Cone Angle | 35° (macroscopic) | ||
AFM Cantilever | |||
Short Cantilever | Long Cantielver | ||
Shape | Triangle | Triangle | |
Length | 100um (90-110um) | 200um (190-210um) | |
Width | 16um (11-21um) | 30um (25-35um) | |
Thickness | 520nm (470-570nm) | 520nm (470-570nm) | |
Force Constant | 0.27N/m | 0.06N/m | |
Resonance Frequency | 30kHz | 10kHz | |