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(원자현미경/주사탐침현미경 탐침)
Product Description | ||||
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Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.
The DPER probes are made by depositing a thin metal coating on Si tips. The thickness of the coating on the flat cantilever surface is about 15 nm, resulting in a coated tip radius below 20 nm. The probes can be used for imaging samples with higher resolution in XY directions.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | ||||
The DPER probes are made by depositing a thin Pt coating on both sides of the Si cantilevers. The thickness of the coating on the flat cantilever surface is about 15 nm. | ||||
AFM Tip | ||||
Shape | Rotated | |||
Height | 15um (12-18um) | |||
Radius | <20nm | |||
Full Cone Angle | 40° | |||
AFM Cantilever | ||||
Cantilever A | Cantilever B | Cantilever C | Cantilever D | |
Shape | Beam | Beam | Beam | Beam |
Length | 500um | 210um | 150um | 100um |
Width | 30um | 30um | 30um | 50um |
Thickness | 2.7um | 2.7um | 2.7um | 2.7um |
Force Constant | 0.2N/m (0.1-0.4N/m) | 2.7N/m (1.1-5.6N/m) | 7N/m (3-16N/m) | 42N/m (17-90N/m) |
Resonance Frequency | 15kHz (12-18kHz) | 80kHz (60-100kHz) | 155kHz (115-200kHz) | 350kHz (250-465kHz) |