AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ SD-PL2-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.
The probe offers unique features: plateau diameter of typically 1.8 µm single crystalline silicon highly doped silicon to dissipate static charge Al coating on detector side of cantilever high mechanical Q-factor for high sensitivity
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Aluminium coating on detector side of cantilever. | |||
AFM Tip | |||
Shape | Plateau | ||
Plateau Diameter | 1.8 ± 0.5µm | ||
Plateau Rod Height | > 2.0µm | ||
Plateau Edge Radius | 0.2-0.4um | ||
Plateau Tip Height Overall | 10-15um | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um (115-135um) | ||
Width | 30um (22.5-37.5um) | ||
Thickness | 4um (3-5um) | ||
Force Constant | 42N/m (10-130N/m) | ||
Resonance Frequency | 330kHz (204-497kHz) | ||