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(원자현미경/주사탐침현미경 탐침)
Product Description | ||||
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Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode.
The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | ||||
Aluminium reflex coating on detector side of the cantilever, 30 nm thick | ||||
AFM Tip | ||||
Shape | Rotated | |||
Height | 17um (15-19um) | |||
Setback | 15um (10-20um) | |||
Radius | <10nm | |||
Half Cone Angle | 20°-25° front view, 25°-30° from side, 10° at the apex | |||
AFM Cantilever | ||||
Cantilever A | Cantilever B | Cantilever C | Cantilever D | |
Shape | Beam | Beam | Beam | Beam |
Length | 500um (490-510um) | 210um (200-220um) | 150um (140-160um) | 100um (90-110um) |
Width | 30um (25-35um) | 30um (25-35um) | 30um (25-35um) | 50um (45-55um) |
Thickness | 2.7um (1.7-3.7um) | 2.7um (1.7-3.7um) | 2.7um (1.7-3.7um) | 2.7um (1.7-3.7um) |
Force Constant | 0.2N/m (0.04-0.7N/m) | 2.7N/m (0.4-10N/m) | 7.4N/m (1-29N/m) | 420/m (7-160N/m) |
Resonance Frequency | 15kHz (10-20kHz) | 80kHz (50-110kHz) | 150kHz (70-230kHz) | 350kHz (200-500kHz) |