AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
---|---|---|---|
The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
The probe offers unique features: excellent tip radius of curvature highly doped silicon to dissipate static charge Au coating on detector side of cantilever chemically inert It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
|||
Coating Description | |||
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length. | |||
AFM Tip | |||
Shape | Standard | ||
Height | 10-15um | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 150um (140-160um) | ||
Width | 27um (19.5-34.5um) | ||
Thickness | 2.8um (1.8-3.8um) | ||
Force Constant | 7.4N/m (1.2-29N/m) | ||
Resonance Frequency | 160kHz (75-265kHz) | ||