AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features: excellent tip radius of curvature typical aspect ratio at 200 nm from tip apex in the order of 4:1 monolithic material highly doped silicon to dissipate static charge chemically inert high mechanical Q-factor for high sensitivity
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length. | |||
AFM Tip | |||
Shape | Supersharp | ||
Radius | |||
Half Cone Angle | <10° at 200nm from apex | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (215-235um) | ||
Width | 28um (20-35um) | ||
Thickness | 3um (2-4um) | ||
Force Constant | 2.8N/m (0.5-9.5N/m) | ||
Resonance Frequency | 75kHz (45-115kHz) | ||