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AFM/SPM Standard Sample
(원자현미경/주사탐침현미경 표준시편)
Product Description | |||
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The flatness standard consists of a superflat plane and is intended to be used to analyze and correct the scanner bow of the piezo-scanner used in most Scanning Force Microscopes. The standard consists of a quartz substrate with a chromium layer. The active area is located in the center of the chip and is surrounded by the FindMe structure. |