AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ SD-PL2-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.
The probe offers unique features: plateau diameter of typically 1.8 µm single crystalline silicon highly doped silicon to dissipate static charge Al coating on detector side of cantilever chemically inert high mechanical Q-factor for high sensitivity
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Aluminium coating on detector side of cantilever. | |||
AFM Tip | |||
Shape | Plateau | ||
Plateau Diameter | 1.8 ± 0.5µm | ||
Plateau Rod Height | >2.0 µm | ||
Plateau Edge Radius | 0.2-0.4um | ||
Plateau Tip Height Overall | 10-15um | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (440-460um) | ||
Width | 50um (42.5-57.5um) | ||
Thickness | 2um (1-3um) | ||
Force Constant | 0.2N/m (0.02-0.77N/m) | ||
Resonance Frequency | 13kHz (6-21kHz) | ||