The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ SD-PL2-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

plateau diameter of typically 1.8 µm

single crystalline silicon

highly doped silicon to dissipate static charge

Al coating on detector side of cantilever

chemically inert

high mechanical Q-factor for high sensitivity

It is compatible with:

Bruker / Veeco / Digital Instruments

Keysight / Agilent / Molecular Imaging

Asylum Research

Park Systems

JEOL

JPK

etc.