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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Probes of the 38 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Backside Al coated. Coating thickness - 30 nm. |
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AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <8nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | Cantilever C | |
Shape | Beam | Beam | Beam |
Length | 250um | 350um | 300um |
Width | 32.5um | 32.5um | 32.5um |
Thickness | 1um | 1um | 1um |
Force Constant | 0.09N/m (0.01-0.36N/m) | 0.03N/m (0.003-0.13N/m) | 0.05N/m (0.005-0.21N/m ) |
Resonance Frequency | 20kHz (8-32kHz) | 10kHz (5-17kHz) | 14kHz (6-23kHz ) |