(원자현미경/주사탐침현미경 탐침)
Product Description |
|||
---|---|---|---|
NANOSENSORS™ AdvancedTEC™ NCAu AFM tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features: REAL TIP VISIBILITY FROM TOP metallic conductivity of the tip high mechanical Q-factor for high sensitivity aspect ratio of the last 1.5 µm of the tip > 4:1 (from front and side) tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces highly doped single crystal silicon (0.01-0.025 Ohm*cm) rectangular cantilever with trapezoidal cross section holder dimensions are 1.6 mm x 3.4 mm
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
|
|||
Coating Description | |||
- Au (골드) 70nm 두께 반사면 코팅 |
|||
AFM Tip | |||
Shape | Visible | ||
Height | 15-20um | ||
Radius | <10nm | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 160um (150-170um) | ||
Width | 45um (40-50um) | ||
Thickness | 4.6um (3.6-5.6um) | ||
Force Constant | 45N/m (12-110N/m) | ||
Resonance Frequency | 335kHz (210-490kHz) | ||