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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilever aperture SNOM probes are best suited for high efficiency SNOM imaging and simultaneous topography without damaging the sample or tip. Aperture is precisely controlled by Focused Ion Beam (FIB) milling with in +/- 10nm.
It is compatible with: - AFMWORKSHOP - APEReaserch - Bruker - HITACHI - Keysight - Oxford - Park Systems - Probes Inc. - etc. |
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Coating Description | |||
Aluminium on tip side coating of the cantilever, 100 nm thick | |||
AFM Tip | |||
Shape | Hollow Pyramid | ||
Material | SiO2 | ||
Opening Angle | 70° | ||
Coating | Al, 100nm | ||
Aperture | Customized, Min. 50nm | ||
AFM Cantilever | |||
Shape | Rectangular | ||
Material | Si | ||
Reflex Coating | None | ||
Parameter | SNOM-C | SNOM-NC | |
Force Constant | 1N/m | 16N/m | |
Resonance Frequency | 21kHz | 130kHz | |
Length | 500um | 200um | |
Width | 55um | 55um | |
Thickness | 4um | 4um | |