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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 240AC series is designed for AC mode AFM imaging of soft samples. The gold coated version is suitable for biological applications, tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
70 nm Au on both sides of the cantilever | |||
AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <30nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 240um (230-250um) | ||
Width | 40um (38-42um) | ||
Thickness | 2.6um (2.1-3.1um) | ||
Force Constant | 2N/m (0.6-3.9N/m) | ||
Resonance Frequency | 70kHz (45-90kHz) | ||