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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 240AC-PP is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
25 nm Pt on both sides of the cantilever. | |||
AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <25nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 240um (230-250um) | ||
Width | 40um (38-42um) | ||
Thickness | 2.6um (2.1-3.1um) | ||
Force Constant | 2N/m (0.6-3.9N/m) | ||
Resonance Frequency | 70kHz (45-90kHz) | ||