Single Point Kelvin Probe System
(싱글 포인트 켈빈 프로브)
Description | |||||||
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Our single-point Kelvin probe (KP020) system is the introductory system to the KP Technology Ltd range. The off-null signal detection method allows very high quality measurements of the work-function (φ), otherwise known as the Volta potential (Δψ), and Fermi level of materials. The economical system enables users to quickly record non-scanning data and the dedicated software allows full digital control of all parameters to match the exact requirements of the sample under investigation. The recorded data is easily exportable to analysis software. For rapid events, the KP020 can record work function at a rate of over 300 work-function measurements per minute, or alternatively, the system will track slow work-function evolution over a number of days. There is an in-built height regulation feature to control the tip to sample spacing during measurements which gives rise to stable, reliable and repeatable data. |
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Features | Applications | ||||||
• Work function measurement by Kelvin probe | • Organic and non-organic semiconductors | ||||||
• Work function resolution of 1-3 meV | • Metals and metal alloys | ||||||
• Modular system for upgrades and add-ons | • Thin Films and surface oxides | ||||||
• Economical, Entry system | • Nanotechnology | ||||||
• USB version plug and play | • Corrosion | ||||||
• Off-null signal detection system | • Solar cells and organic photovoltaics | ||||||
Specifications | |||||||
• Tip material / diameter | Standard 2mm gold tip | ||||||
• Work function resolution | 1-3 meV | ||||||
• Probe translation | 25mm manual translator | ||||||
• Visualisation | Single-point work fuction / contact potiential difference measurement | ||||||
• Oscilloscope | Digital TFT oscilloscope for real time signal | ||||||
• Test sample | Godl / Al sample | ||||||
• Control Supplied | PC control with dedicated software for full digital control of all parameters | ||||||
• Height regulation | Through DC probe adustments | ||||||
• Detection system | Off-null with parasitic capacity rejection | ||||||
• Enclosure | 450mm x 450mm optical / Faraday enclosure included | ||||||
• Optical system | Colour camera with zoom lns and monitor | ||||||
Upgrades and Add-Ons | |||||||
• Scanning Kelvin Probe system | |||||||
• Relative humidity control and notroge environmental chamber | |||||||
• Ambient Pressure Phtoemission Spectroscopy | |||||||
• Sample heater to 250°C | |||||||
• Surface Photovoltage Spectroscopy (400-1000nm) | |||||||
• Surface Photovoltage (QTH or LED) |