AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this AFM tip offers an excellent tip radius of curvature.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
PtIr5 Coating
The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.
The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees. |
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AFM Tip | |||
Shape | Arrow | ||
Height | 12um (10-15um) | ||
Radius | <25nm | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (445-455um) | ||
Width | 45um (40-50um) | ||
Thickness | 2um (1.5-2.5um) | ||
Force Constant | 0.2N/m (0.06-0.38N/m) | ||
Resonance Frequency | 14kHz (10-19kHz) | ||