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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.The AFM holder chip fits most commercial AFM systems as it is industry standard size.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
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AFM Tip | |||
Shape | Rotated | ||
Height | 17um (15um-19um) | ||
Setback | 15um (10-20um) | ||
Radius | <10nm | ||
Half Cone Angle | 20°-25° front view, 25°-30° from side, 10° at the apex | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (215-235um) | ||
Width | 38um (33-43um) | ||
Thickness | 7um (6-8um) | ||
Force Constant | 48N/m (28-75N/m) | ||
Resonance Frequency | 190kHz (160-220kHz) | ||