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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 240AC-MA is designed for Magnetic Force Microscopy (MFM) measurements. The hard magnetic tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Co alloy on the tip side of the cantilever, 30 nm Al on the back side of the cantilever. | |||
AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <60nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 240um (230-250um) | ||
Width | 40um (38-42um) | ||
Thickness | 2.6um (2.1-3.1um) | ||
Force Constant | 2N/m (0.6-3.9N/m) | ||
Resonance Frequency | 70kHz (45-90kHz) | ||