Atomic Force Microscope

• Robust and reliable operation high-end research Scanning Probe Microscope
• Monoatomic step resolution even with 100 x 100 μm scanner
• High accuracy in repositioning overall scanning range with no border distortion
• High Sensitivity for low force measurements
• Best for soft materials
• Modular structure capable to provide different scanning probe modes. The system can be upgraded with different new modules.

Working modes:

A100 supports major SPM scanning techniques ¹: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Force Modulation, Lateral Force Microscopy, Force Curves Analysis Electric properties, Magnetic Force Microscopy, STM, etc.

 ¹: Included by way of example

A100 SPM scanning system:

The system can be equipped with a various type of scanners for different working ranges

Standard scanner technical data*:

X-Y scan size:

• 100 X 100 μm (high voltage mode)
• 10 X 10 μm (low voltage mode)
• High voltage closed loop resolution: 2 nm
• High voltage open loop resolution: 0.2 nm
• Closed loop linearity: 0.1%

Z scan size: 

• 10 μm (high voltage mode)
• 1 μm (low voltage mode)
• Resolution: 0.16 nm (high voltage mode), 0.02 nm (low voltage mode)

Based on specific demands other scanning ranges can be combined by the user in different configurations**.

AFM Head

AFM Head with holder for commercial cantilevers. The holder can be removed to easy mount cantilevers.

The head also houses laser. photodiode sensor with preamplifler.

SPMCU - SPM Control Unit

SPM Control Unit and PC (equipped with a multi input-output board) drives the scanner, data acquisition and

sample motion.

Tip to sample distance is controlled by ultra-low noise analog feedback, digitally driven by PC.

High speed and temporal precision are provided by hardware timing.

High Voltage Amplifier

HVA is an amplifier module projected to drive A-100 scanning Stage

Acquisition software

Software runs under Windows and is composed of a multi-window applications control and data acquisition.

The software comes equipped with simple filters for immediate analysis of acquired images. The software controls

all the parameters of the instrument.

Accessories:

A.P.E. Research has developed additional AFM tools for specific measurements modes* (EFM, MFM, STM, Phase Imaging, CAFM, KPM Nanolithography, etc,,,).