Atomic Force Microscope
Working modes:
A100 supports major SPM scanning techniques ¹: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Force Modulation, Lateral Force Microscopy, Force Curves Analysis Electric properties, Magnetic Force Microscopy, STM, etc.
¹: Included by way of example
A100 SPM scanning system:
The system can be equipped with a various type of scanners for different working ranges
Standard scanner technical data*:
X-Y scan size:
Z scan size:
Based on specific demands other scanning ranges can be combined by the user in different configurations**.
AFM Head
AFM Head with holder for commercial cantilevers. The holder can be removed to easy mount cantilevers.
The head also houses laser. photodiode sensor with preamplifler.
SPMCU - SPM Control Unit
SPM Control Unit and PC (equipped with a multi input-output board) drives the scanner, data acquisition and
sample motion.
Tip to sample distance is controlled by ultra-low noise analog feedback, digitally driven by PC.
High speed and temporal precision are provided by hardware timing.
High Voltage Amplifier
HVA is an amplifier module projected to drive A-100 scanning Stage
Acquisition software
Software runs under Windows and is composed of a multi-window applications control and data acquisition.
The software comes equipped with simple filters for immediate analysis of acquired images. The software controls
all the parameters of the instrument.
Accessories:
A.P.E. Research has developed additional AFM tools for specific measurements modes* (EFM, MFM, STM, Phase Imaging, CAFM, KPM Nanolithography, etc,,,).