n style="font-size: 18.6667px; font-weight: 600;">AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.
Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side. |
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AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <30nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um | ||
Width | 50um | ||
Thickness | 2um | ||
Force Constant | 0.18N/m (0.06-0.4N/m) | ||
Resonance Frequency | 13kHz (10-17kHz) | ||