AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode. All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this probe offers an excellent tip radius of curvature.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.
As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees. |
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AFM Tip | |||
Shape | Standard | ||
Height | 12um (10-15um) | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (220-230um) | ||
Width | 48um (42.5-52.5um) | ||
Thickness | 1um (0.5-1.5um) | ||
Force Constant | 0.2N/m (0.02-0.7N/m) | ||
Resonance Frequency | 25kHz (10-39kHz) | ||