NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

length of the high aspect ratio portion of the tip > 1.5 µm

typical aspect ratio of this portion in the order of 12:1 (when viewed from side as well as along cantilever axis)

half cone angle of the high aspect ratio portion typically < 2.8°

excellent tip radius of curvature

-  사용가능 AFM/SPM 장비:

  AFMWorkShop

  A.P.E.Research

  Bruker / J.P.K / S.I.S-GmbH / Veeco / DI

  Hitachi / Seiko

  Keysight / Agilent / Pacific NanoTechnology / MI

  NanoFocus

  NanoInk

  Oxford / Asylum

  Park Systems / PSIA

  Probes

  등. 모든 상용화 장비

-  Al (알루미늄) 30nm 두께 반사면 코팅