AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Optimized positioning through maximized tip visibilityNanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. | |||
AFM Tip | |||
Shape | Arrow | ||
Height | 10-15um | ||
Radius | <10nm | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 240um (235-245um) | ||
Width | 35um (30-40um) | ||
Thickness | 3um (2.5-3.5um) | ||
Force Constant | 2.8/m (1.4-5.8N/m) | ||
Resonance Frequency | 75kHz (58-97kHz) | ||