AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The NANOSENSORS™ PPP-QLC-MFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated tip, a high aspect ratio at the last few hundred nanometers of the tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.
Due to the low magnetic moment of the tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.
The SPM probe offers unique features: hard magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization of app. 225 emu/cm3) effective magnetic moment 0.75x of standard probes excellent tip radius of curvature magnetic resolution better than 35 nm Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5 excellent mechanical Q-factor under UHV conditions for high sensitivity precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series
As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended. It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The soft magnetic coating on the tip has a coercivity of app. 0.75 Oe and a remanence magnetization of app. 225 emu/cm3 (these values were determined on a flat surface). | |||
AFM Tip | |||
Shape | Supersharp | ||
Height | 10-15um | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (215-235um) | ||
Width | 28um (20-35um) | ||
Thickness | 3um (2-4um) | ||
Force Constant | 2.8N/m (0.5-9.5N/m) | ||
Resonance Frequency | 75kHz (45-115kHz) | ||