AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
---|---|---|---|
Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
|
|||
Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
|||
AFM Tip | |||
Shape | Standard | ||
Height | 10-15um | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (220-230um) | ||
Width | 38um (33-43um) | ||
Thickness | 7um (6.5-7.5um) | ||
Force Constant | 48N/m (31-71N/m) | ||
Resonance Frequency | 190kHz (160-210kHz) | ||