AFM/SPM AFM SPM SThM Standard Sample Metal Disk Mica HOPG

AFM PROBE PR Series NonContact/Tapping Mode Force Modulation Contact Mode Life Science Probe Ultra High Frequency Probe Conductive Probe Magnetic Probe Super Sharp Probe Indentation & Lithography High Aspect Ratio Probe ScanAsyst® PeakForce™ Silicon Nitride Probe Tipless & Array Probe Plateau Probe Sphere Probe Functionalized Probe Calibration Sample

Indenter Tip & Etc. Diamond Tip Sapphire Tip Tungsten Carbide Tip Fused Silica Aluminum Sample Crystal Bond Sample Puck Heating Stage

SEM Table Top SEM Normal SEM Big Chamber SEM

실험기자재 실린지 펌프 전자저울 초음파 세척기 자력교반기 가열교반기 온습도계 오븐&건조기 데시게이터 원심분리기 레귤레이터

실험소모품 시료 케리어 비커류 필터페이퍼 실린더 피펫 페트리디쉬 실린지&실린지필터 장갑&와이퍼&파라필름 마이카&디스크 카본테이프&페이스트류 프로브스테이션 팁

기타연구장비 Raman Microscope Soft Lithography System SEEC System Anti Vibration System Optical Microscope

TEM Gird Formvar Film Carbon Film Formvar & Carbon Film Additional Film Quantifoil Holey Carbon Film C-Flat Holey Carbon Film Graphene Support Film

Nano Materials Elements & Alloys Single Oxides Multi Oxides Compounds

Wafer/Target/Etc. ITO Glass Silicon Wafer GaAs Wafer Single Crystal SOI Wafer Glass & Substrate Ceramic Substrate Sputtering Targets Evaporation Materials

AdhesionCase Sample Case

Work Function Single Point Kelvin Probe Scanning Kelvin Probe Photoemission Spectroscopy Surface Photovoltage UHV Kelvin Probe UHV Scanning Kelvin Probe

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